Measurement of Dot Area

Details

Document ID: 
10685
Author(s): 
Sébastien Arnaud
Year: 
2001
Pages: 
17

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Abstract

In this project, three different methods of image analysis have been compared to determine the physical area of dots on five different substrates, on uncoated, matte coated and gloss coated papers, film and plate. The purpose of this study was to learn the advantages and drawbacks of each method, to write down the procedure of measuring dot area with each device, and to try to determine which one was the best. The three devices were all based on an optical microscope, an Olympus BH2. The first method used a Jandel planimeter, the second used Adobe Photoshop, and the last one used a new software program at GATF : ImageXpert. Another reason for this work is to evaluate ImageXpert relative to the two other methods.

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