Details
Document ID:
920066
Year:
1992 Vol. 1
Pages:
15
Pricing
Digital, Non-Member:
$20.00
Photo, Member:
$15.00
Photo, Non-Member:
$30.00
Abstract
A technique to measure the halftone dot that relies on an analysis of the Fourier Transform, or optical power spectrum of a large nominally uniform array of halftone dots is discussed. The technique uses optical computing to enable an optical transfer function of the dot pattern without digital computation and then provides a quick mathematical analysis.