Power Spectrum Analysis of Laser Generated Halftone Patterns

Details

Document ID: 
920066
Author(s): 
R. S. Fisch
Year: 
1992 Vol. 1
Pages: 
15

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Abstract

A technique to measure the halftone dot that relies on an analysis of the Fourier Transform, or optical power spectrum of a large nominally uniform array of halftone dots is discussed. The technique uses optical computing to enable an optical transfer function of the dot pattern without digital computation and then provides a quick mathematical analysis.

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